The center provides characterization methods and devices as well as the necessary expertise for the accelerated development of nanotechnological products by Berlin SMEs. Analytical measurements and scientific and technical advice are provided on request.

Methods

The following analysis methods are available:

• X-ray diffractometry (XRD measurements) for crystallographic investigations (Bragg-Brentano, parallel beam with a high-temperature chamber for in-situ investigations)
• Small-angle X-ray scattering (SAXS) for investigating 3-dimensional structures, particles and assemblies in the range of 1 to 100 nm
• High-resolution scanning electron microscopy (SEM) coupled with EDX
• BET measurements to determine the size of surfaces, e.g. porous solids, by physisorption of N2 or Kr, determination of micropores and pore size distributions
• ICP-OES (inductively coupled plasma) measurements for elemental analysis
• HPLC-MS for liquid product analysis and GC for gas phase analysis
• Electrochemical headspace analysis using MS and in-situ DEMS (Differentially Pumped Mass Spectrometer)
• Electrochemical in-situ investigations using FTIR (ATR and external reflection (IRRAS))
• Microwave digester, high temperature semi-continuous reactor, flow tube furnaces
• MEA fuel cell test station
• Rotating ring-disk electrodes for electrochemical characterizations using cyclic voltammetry, chronopotentiometry, amperometry, impedance measurements, .....

Funded by the European Union to promote innovation and the knowledge-based economy (EFRE 20072013 2/19). 

Please send inquiries with a brief description of the problem to the following e-mail address: pstrasser@tu-berlin.de.