The Cross Section Polisher enables the preparation of cross sections of a wide variety of materials using an argon ion beam. For sensitive specimens, the process can be performed by cooling with liquid nitrogen at defined low temperatures.
In addition, post-polishing of sections with argon ions and C vapor deposition for establishing conductivity can be performed in the Cross Section Polisher.
A variety of holders are available for this purpose.
The specimen is clamped into the holder and the aperture is positioned flush with the beam on the specimen.
The area that protrudes from under the aperture is cut away using the ion beam.
The width of the cut is about 1 mm.
With the holder for wide surfaces, cross sections up to 8 mm can be cut.
The specimen sits - depending on the desired cutting depth - deeper than in the standard holder. As a result, the specimen vibrates more deeply and a larger area is machined. It should be noted that this increases the cutting time many times over.