Center for Electron Microscopy (ZELMI)

Cryo Cross Section Polisher JEOL IB-19520CCP

The Cross Section Polisher enables the preparation of cross sections of a wide variety of materials using an argon ion beam. For sensitive specimens, the process can be performed by cooling with liquid nitrogen at defined low temperatures.

In addition, post-polishing of sections with argon ions and C vapor deposition for establishing conductivity can be performed in the Cross Section Polisher.

A variety of holders are available for this purpose.

cross section

The specimen is clamped into the holder and the aperture is positioned flush with the beam on the specimen.

The area that protrudes from under the aperture is cut away using the ion beam.

The width of the cut is about 1 mm.

wide area milling

With the holder for wide surfaces, cross sections up to 8 mm can be cut.
The specimen sits - depending on the desired cutting depth - deeper than in the standard holder. As a result, the specimen vibrates more deeply and a larger area is machined. It should be noted that this increases the cutting time many times over.

C vapor deposition

The ion beam hits the carbon tablet at a small angle. This creates a carbon mist which is deposited on the sample clamped opposite.


Depending on the target application, a suitable carbon layer thickness can be achieved by different voltage and time. However, it is not measurable.

existing holders

left holder: the sample is glued on a metal block, the sample can be placed well by a possible feed.

maximale specimen size 11 x 10 x 2 mm (b x l x h).


right holder: maximale specimen size 11 x 8 x 3 mm (b x l x h).

existing holder


Post polishing of surfaces

The sample is positioned in the rotation holder at a minimal angle to the ion beam. This strikes the surface and levels the residual roughness.

Specimen in holder seen from the front

Control of the process on screen with indoor camera


Pearl from welding process


brown raw eggshell