Center for Electron Microscopy (ZELMI)

Devices of the ZELMI

The following equipment is available for service work at the Electron Microscopy Central Facility:

Electron microscopes

Trasmitted Electron microscopes:

JEM-Arm300F2 "GrandARM2" S/TEM - Fa. Jeol
Titan 80-300 Berlin Holography Special - Fa. FEI
Tecnai G2 20 S-Twin S/TEM - Fa. FEI

Scanning Electron microscopes:

Gemini G-500 NanoVP - Fa. Zeiss
Gemini DSM 982 - Fa. Zeiss
SU8030 - Fa. Hitachi
S-4000 - Fa. Hitachi
S-2700 - Fa. Hitachi
S-520 - Fa. Hitachi

FIB:
Helios Nanolab 600 - Fa. FEI

electron probe microanalyzer:
JXA 8530F - Fa. Jeol

AFM:
Park XE 100

Lightmicroscopes

Stereomicroscope:
SMZ-U - Fa. Nikon
diverse for preparation

lightmicroscopes:
Polyvar 2 - Fa. Reichert-Jung
Polyvar-Met - Fa. Reichert-Jung
Univar - Fa. Reichert-Jung

Preparation equipment

Cross-Section-Polisher:
IB-19520 CCP - Fa. Jeol

Coating equipment:
C-Coater Cressington 328 - Fa. EO
C-Coater - Fa. Leica ACE 600
C-Coater - Fa. Edwards
Au-Coater SCD 030 - Fa. Balzers
Au/Cr-Coater Cressington 208 HR
Pt/Pd-Coater SCD 040 - Fa. Balzers

Plasma Ashing:
Model 1020 - Fa. Fischione
100-E - Fa. Technics Plasma GmbH

Metallography:
Qcut 105M Cutting machine - Fa. QATM
Isomet - Fa. Buehler
Grinding and polishing equipment Knuth-Rotor and Automet 250 - Fa. Buehler
Vibratory polisher Vibromet-2 - Fa. Buehler

TEM-Preparation:
Wire saw Well
Disc-Grinder and Dimple-Grinder - Fa. Gatan

Ion dilution device:
Model 1010 - Fa. Fischione
Model 691 Pips - Fa. Gatan

Ultramikrotom
Reichert-Jung