JEOL JEM-ARM300F2 "GrandARM2" S/TEM
© TU Berlin
This state-of-the-art S/TEM instrument offers exceptional performance in terms of spatial resolution and elemental analysis:
- First GrandARM2 outside Japan
- Cold field emission electron source
- 60 kV, 80 kV, 200 kV and 300 kV accelerating voltages
- JEOL ETA Probe Cs corrector
- Objective pole pieces with wide spacing
- 63 pm STEM DF resolution @ 300 kV, 110 pm STEM DF resolution @ 80 kV
- EDS detector with 2 x 158 mm2 and a collection angle of 2.2 sr
- SE/BSE detector
- BF, ABF, DF and HAADF detectors
- Quantum Merlin pixelated detector with 256 x 256 pixels and a max. frame rate of 2400 Hz @ 6 bit
- TVIPS TemCam XF416 CMOS camera with 4096 x 4096 pixels
- TVPIS Universal Scan Generator for arbitrary scan patterns
- Specimen holder
- Double tilt holder for EDX
- Retainer holder for sample exchange with microprobe
- Single-tilt holder with four slots for high sample throughput
- Double-tilt biasing holder for MEMS chips (Protochips Fusion Select; DFG procurement through Dr. Laura Niermann's project)
The instrument is operated jointly by members of AG Lehmann and ZELMI.
The GrandARM2 S/TEM instrument has been funded within the framework of a large instrument application. We are very grateful to the Deutsche Forschungsgemeinschaft and the TU Berlin for the funding!
FEI Titan 80-300 Berlin Holography Special TEM
© TU Berlin
This excellent high-performance transmission electron microscope (TEM) with atomic resolution has been optimized by its electron optics specifically for electron holography. It offers:
- First Titan X lens worldwide specifically for electron holography
- High-brightness Schottky electron source
- 80, 200 and 300 kV accelerating voltage
- Up to three Möllenstedt biprisms
- Lorentz lens
- Image Cs corrector
- Gatan US1000 CCD camera
- 75 pm information limit at 300 kV accelerating voltage
The Titan TEM has been a joint project with the company FEI and has been financially supported by the German Research Foundation and the TU Berlin within the framework of a large-scale equipment application.
TEM Specimen Preparation
© TU Berlin
Often, it is not the instrument but the quality of the TEM sample itself that limits the performance of electron microscopy experiments. Therefore, a dedicated sample preparation laboratory with ultimate preparation tools and methods is equally important. In addition to the ZELMI preparation laboratory in the KWT building, the Electron Microscopy Building houses a dedicated preparation laboratory predominantly for TEM specimens. Among others, the following instruments are used:
- Gatan Dimpler
- Gatan PIPS
- Fishione Ion-Mill
- Fishione Plasma-Cleaner
