Experimental Physics/Electron- and Ion-Nanooptics

Head of Academic Chair

Prof. Dr.

Michael Lehmann

Experimental Physics/Electron- and Ion-Nanooptics

michael.lehmann@tu-berlin.de

+49 30 314-22567

+49 30 314-27850

Organization name Institute of Optics and Atomic Physics
Office ER 1-1
Building ER
Room ER 292
Address Sekr. ER 1-1, Straße des 17. Juni 135
10623 Berlin

Curriculum Vitae

Scientific Career 
2013-2014Otto Monstedt Guest Professorship (limited for 6 months) at the Technical University Danmark in Lyngby
since 2006Scientific Head of the Center for Electron Microscopy (ZELMI)
since 2006Professor for Experimental Physics/Electron- and Ion-Nanooptics, Technische Universität Berlin
2004Habilitation in Experimental Physics at the Technical University of Dresden, Mentor: Prof. Hannes Lichte
2000-2006Technical Director of the Triebenberg Laboratory for Electron Microscopy at the Technical University of Dresden
2000-2006Scientific assistant (unlimited) at the Institute for Structural Physics at the Technical University of Dresden
1997-1999Postdoc in the Collaborative Research Center 422 at the Technical University of Dresden
1997Doctorate in physics at the Eberhard Karls University Tübingen with Prof. Hannes Lichte
1994Three months guest stay at the Oak Ridge National Lab, USA
1992-1996Scientific assistant at the Institute of Applied Physics, Eberhard Karls University, Tübingen, Germany
1992Diploma degree in physics at the Eberhard Karls University Tübingen with Prof. Hannes Lichte
1986-1992Studies of physics at the Eberhard Karls University Tübingen
  
Other activities. 
2019Conference chair (together with Prof. Christoph Koch, HU Berlin) of the Microscopy Conference MC2019.
2016-2017President-elect of the German Electron Microscopy Society (DGE e.V.)
2015-2022Chairman of the Physics Commission at the Technical University of Berlin
2014-2015Elected Vice President of the German Electron Microscopy Society (DGE e.V.)
2009-2013 and 2019 - 2020Executive Director of the Institute of Optics and Atomic Physics

Publications and Patents (Selection)

N. Owschimikow, B. Herzog, B. Lingnau, K. Lüdge, A. Lenz, H. Eisele, M. Dähne, T. Niermann, M. Lehmann, A. Schliwa, A. Strittmatter, U.W. Pohl
Submonolayer Quantum Dots
In: Kneissl M., Knorr A., Reitzenstein S., Hoffmann A. (eds) Semiconductor Nanophotonics. Springer Series in Solid-State Sciences, vol 194 (2020) pp 13-51
DOI: 10.1007/978-3-030-35656-9_2

U.W. Pohl, A. Strittmatter, A. Schliwa, M. Lehmann, T. Niermann, T. Heindel, S. Reitzenstein, M. Kantner, U. Bandelow, T. Koprucki, H.-J. Wünsche
Stressor-Induced Site Control of Quantum Dots for Single-Photon Sources
In: Kneissl M., Knorr A., Reitzenstein S., Hoffmann A. (eds) Semiconductor Nanophotonics. Springer Series in Solid-State Sciences, vol 194 (2020) pp 53-90
DOI: 10.1007/978-3-030-35656-9_3

Tolga Wagner, Michael Lehmann and Tore Niermann.
“ARRANGEMENT AND METHOD FOR DETECTING MEASURED VALUE ON BASIS OF ELECTRON HOLOGRAPHY.”,
Publication number: CN112534358A; EP3611574A1; EP3837587A1; WO2020035205A1 (2020).
Patent: worldwide.espacenet.com/publicationDetails/originalDocument?flavour=trueFull&locale=en_EP&FT=D&CC=EP&NR=3611574A1

L. Meißner, T. Niermann, D. Berger, M. Lehmann
Dynamical diffraction effects on the geometric phase of inhomogeneous strain fields
Ultramicroscopy 207 (2019) 112844
DOI: 10.1016/j.ultramic.2019.112844

Tolga Wagner, Tore Niermann, Felix Urban, Michael Lehmann
Nanosecond electron holography by interference gating
Ultramicroscopy 206 (2019) 112824
DOI: 10.1016/j.ultramic.2019.112824

Michael Lehmann, Tore Niermann and Tolga Wagner
“METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETRIC MEASUREMENT.”
Publication number: EP3376522A1; TW201833521A; US2020103213A1; WO2018166786A1 (2018)
Patent (granted): patentimages.storage.googleapis.com/3f/99/6a/e600762da71959/US20200103213A1.pdf

T. Niermann, M. Lehmann, T. Wagner
Gated interference for time-resolved electron holography
Ultramicroscopy 182 (2017) 54–61
DOI: 10.1016/j.ultramic.2017.06.017

Michael Lehmann and Hannes Lichte
Electron Holography
in: Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry
edited by C. Barry Carter and David B. Williams
Springer Verlag Berlin Heidelberg (2016), pages 215 - 232
DOI: 10.1007/978-3-319-26651-0
ISBN: 978-3-319-26649-7
Springer Verlag Berlin Heidelberg

Hannes Lichte and Michael Lehmann
Electron Waves, Interference & Coherence
in: Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry
edited by C. Barry Carter and David B. Williams
Springer Verlag Berlin Heidelberg (2016), pages 197 - 214
DOI: 10.1007/978-3-319-26651-0
ISBN: 978-3-319-26649-7
Springer Verlag Berlin Heidelberg

Tore Niermann and Michael Lehmann
Holographic focal series: differences between inline and off-axis electron holography at atomic resolution
J. Phys. D: Appl. Phys. 49 (2016) 194002
DOI: 10.1088/0022-3727/49/19/194002

Stephan Appelfeller, Martin Franz, Milan Kubicki, Paul Reiß, Tore Niermann, Markus Andreas Schubert, Michael Lehmann, and Mario Dähne
Capping of rare earth silicide nanowires on Si(001)
Applied Physics Letters 108 (2016) 013109 (4 pages)
DOI: 10.1063/1.4939693

F. Kießling, T. Niermann, M. Lehmann, J.-H. Schulze, A. Strittmatter, A. Schliwa, and U.W. Pohl
Strain field of a buried oxide aperture
Physical Review B 91 (2015) 075306
DOI: 10.1103/PhysRevB.91.075306

J. B. Park, T. Niermann, D. Berger, A. Knauer, I. Koslow, M. Weyers, M. Kneissl, and M. Lehmann
Impact of electron irradiation on electron holographic potentiometry
Applied Physics Letters 105 (2014) 094102
DOI: 10.1063/1.4894718

Florian Genz, Tore Niermann, Bart Buijsse, Bert Freitag, Michael Lehmann
Advanced double-biprism holography with atomic resolution
Ultramicroscopy 147 (2014) 33 - 43
DOI: 10.1016/j.ultramic.2014.06.002

T. Niermann, F. Kießling, M. Lehmann, J.-H. Schulze, T.D. Germann, K. Pötschke, A. Strittmatter, and U.W. Pohl
Atomic structure of closely stacked InAs submonolayer depositions in GaAs
Journal of Applied Physics 112 (2012) 083505
DOI: 10.1063/1.4758301

H. Lichte, M. Lehmann
Electron holography - basics and applications
Annu. Rev. Modern Physics 71 (2008) 016102
DOI: 10.1088/0034-4885/71/1/016102

M. Lehmann
Influence of the Elliptical Illumination on Acquisition and Correction of Coherent Aberrations in High-Resolution Electron Holography
Ultramicroscopy 100 (2004) 9 - 23
DOI: 10.1016/j.ultramic.2004.01.005

M. Lehmann, H. Lichte
Tutorial on Off-axis Electron Holography
Microscopy and Microanalysis 8 (2002) 447 - 466
DOI: 10.1017/S143192760202014

M. Lehmann, E. Völkl, F. Lenz
Reconstruction of electron off-axis holograms: a new and fast alternative method
Ultramicroscopy 54 (1994) 335 - 344
DOI: 10.1016/0304-3991(94)90133-3