Dr. Stefan Wellert
The Kratky-type instrument SAXSess mc² (Anton Paar) enables the study of structures with small and wide angle X-ray scattering with sizes ranging from 1nm to 100nm. Different types of samples can be measured, e.g. fluids such as colloidal solutions, solids, such as polymer films, fibers powders, nanocomposites, or biological samples (proteins and macromolecules in solutions).This allows the determination of size, shape and size distribution in particle suspensions, molecular weights of polymer solutions, aggregation behavior, porosity in porous materials or structural properties of polymer films and fiber materials.
The D8 diffraction system (Bruker AXS) in reflectometry mode is used to measure thin film samples (e.g. polymer films at silicon wafers) to determine film thickness and interface roughness. Bruker AXS reflectometer is equipped with a Goebel mirrors before the sample. Corresponding to the Cu-Kα1 transition the wavelength of the instrument is 0.1542 nm. In addition to solid planar substrates, also thin liquid films in a Langmuir through can be measured.
Sample holders: vertically displaceable sample stage for planar substrates, Langmuir trough for measurements at fluid interfaces