Publikationen & Patente

Y. Wang, Q. Wang, J. Zhao, T. Niermann, Y. Liu, L. Dai, K. Zheng, Y. Sun, Y. Zhang, J. Schwarzkopf, T. Schroeder, Z. Jiang, W. Ren, G. Niu
A robust high-performance electronic synapse based on epitaxial ferroelectric Hf_0.5Zr_0.5O₂ films with uniform polarization and high Curie temperature
Applied Materials Today, 29, 101587 (2022)

DOI: 10.1016/j.apmt.2022.101587

T. Niermann, L. Niermann, M. Narodovitch, and M. Lehmann;
Accuracy of polarization field measurements by electron holography in InGaN quantum wells
Phys. Rev. B 103 (2021), 075306

DOI: 10.1103/PhysRevB.103.075306

Ta, N.; Bilal, M.U.; Häusler, I.; Saxena, A.; Lin, Y.-Y.; Schleifer, F.; Fleck, M.; Glatzel, U.; Skrotzki, B.; Darvishi Kamachali, R.
Simulation of the theta’ Precipitation Process with Interfacial Anisotropy Effects in Al-Cu Alloys
Materials 14 (2021) 1280

DOI: 10.3390/ma14051280

A. Maltsi, T. Niermann, T. Streckenbach, K. Tabelow, T. Koprucki
Numerical simulation of TEM images for In(Ga)As/GaAs quantum dots with various shapes
Optical and Quantum Electronics, 52, 257 (2020)

DOI: 10.1007/s11082-020-02356-y

Patent (submitted)
Tolga Wagner, Michael Lehmann and Tore Niermann.
“ARRANGEMENT AND METHOD FOR DETECTING MEASURED VALUE ON BASIS OF ELECTRON HOLOGRAPHY.”,
Publication number: CN112534358A; EP3611574A1; EP3837587A1; WO2020035205A1 (2020).

Patent: worldwide.espacenet.com/publicationDetails/originalDocument?flavour=trueFull&locale=en_EP&FT=D&CC=EP&NR=3611574A1

Filip Hjort, Johannes Enslin, Munise Cobet, Michael A. Bergmann, Johan Gustavsson, Tim Kolbe, Arne Knauer, Felix Nippert, Ines Häusler, Markus R. Wagner, Tim Wernicke, Michael Kneissl, and Åsa Haglund
A 310 nm Optically Pumped AlGaN Vertical-Cavity Surface-Emitting Laser
ACS Photonics (2020)

DOI: 10.1021/acsphotonics.0c01382

Florian Weigert, Anja Müller, Ines Häusler, Daniel Geißler, Dieter Skroblin, Michael Krumrey, Wolfgang Unger, Jörg Radnik, Ute Resch‑Genger
Combining HR‑TEM and XPS to elucidate the core–shell structure of ultrabright CdSe/CdS semiconductor quantum dots
Scientific Reports 10 (2020) 20712

DOI: 10.1038/s41598-020-77530-z

José X. Soares, K. David Wegner, David S. M. Ribeiro, Armindo Melo, Ines Häusler, João L. M. Santos, and Ute Resch-Genger
Rationally designed synthesis of bright AgInS₂/ZnS quantum dots with emission control
Nano Res. 13 (2020) 2438–2450

DOI: 10.1007/s12274-020-2876-8

N. Owschimikow, B. Herzog, B. Lingnau, K. Lüdge, A. Lenz, H. Eisele, M. Dähne, T. Niermann, M. Lehmann, A. Schliwa, A. Strittmatter, U.W. Pohl
Submonolayer Quantum Dots
In: Kneissl M., Knorr A., Reitzenstein S., Hoffmann A. (eds) Semiconductor Nanophotonics. Springer Series in Solid-State Sciences, vol 194 (2020) pp 13-51

DOI: 10.1007/978-3-030-35656-9_2

U.W. Pohl, A. Strittmatter, A. Schliwa, M. Lehmann, T. Niermann, T. Heindel, S. Reitzenstein, M. Kantner, U. Bandelow, T. Koprucki, H.-J. Wünsche
Stressor-Induced Site Control of Quantum Dots for Single-Photon Sources
In: Kneissl M., Knorr A., Reitzenstein S., Hoffmann A. (eds) Semiconductor Nanophotonics. Springer Series in Solid-State Sciences, vol 194 (2020) pp 53-90

DOI: 10.1007/978-3-030-35656-9_3

J. Heggemann, S. Appelfeller, T. Niermann, M. Lehmann, M. Dähne
Internal atomic structure of terbium silicide nanowires on Si(001) capped by silicon
Surface Science 690 (2020) 121563

DOI:10.1016/j.susc.2020.121563

René Sachse, Denis Bernsmeier, Roman Schmack, Ines Häusler, Andreas Hertwig, Katrin Kraffert, Jörg Nissen and Ralph Kraehnert
Colloidal bimetallic platinum–ruthenium nanoparticles in ordered mesoporous carbon films as highly active electrocatalysts for the hydrogen evolution reaction
Catal. Sci. Technol., 2020, 10, 2057-2068

DOI: 10.1039/c9cy02285f

Gang Niu, Steven John Leake, Oliver Skibitzki, Tore Niermann, Jerome Carnis, Felix Kießling, Fariba Hatami, Emad Hameed Hussein, Markus Andreas Schubert, Peter Zaumseil, Giovanni Capellini, William Ted Masselink, Wei Ren, Zuo-Guang Ye, Michael Lehmann, Tobias Schülli, Thomas Schroeder, and Marie-Ingrid Richard
Advanced Coherent X-Ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on-Si Electronics and Optoelectronics
Phys. Rev. Applied 11 (2019) 064046

DOI: 10.1103/PhysRevApplied.11.064046

L. Meißner, T. Niermann, D. Berger, M. Lehmann
Dynamical diffraction effects on the geometric phase of inhomogeneous strain fields
Ultramicroscopy 207 (2019) 112844

DOI: 10.1016/j.ultramic.2019.112844

Tore Niermann
Scattering of fast electrons by lattice vibrations
Physical Review B 100 (2019) 144305

DOI: 10.1103/PhysRevB.100.144305

Benjamin Musnier, K. David Wegner, Clothilde Comby-Zerbino, Vanessa Trouillet, Muriel Jourdan, Ines Häusler, Rodolphe Antoine, Jean-Luc Coll, Ute Resch-Genger, and Xavier Le Guével
High photoluminescence of shortwave infrared-emitting anisotropic surface charged gold nanoclusters
Nanoscale 11 (2019) 12092-12096

DOI: 10.1039/c9nr04120f

Norman Susilo, Marcel Schilling, Michael Narodovitch, Hsin-Hung Yao, Xiaohang Li, Bernd Witzigmann, Johannes Enslin, Martin Guttmann, Georgios G. Roumeliotis, Monir Rychetsky, Ingrid Koslow, Tim Wernicke, Tore Niermann, Michael Lehmann, and Michael Kneissl
Precise determination of polarization fields in c-plane GaN/Al_xGa_1-xN/GaN heterostructures with capacitance–voltage-measurements
Japanese Journal of Applied Physics 58 (2019) SCCB08

DOI: 10.7567/1347-4065/ab09dd

Sabine Kosmella, Bastian Klemke, Ines Häusler, Joachim Koetz
From gel-like Pickering emulsions to highly ordered superparamagnetic magnetite aggregates with embedded gold nanoparticles
Colloids and Surfaces A 570 (2019) 331–338

DOI: 10.1016/j.colsurfa.2019.03.017

Stephan Appelfeller, Jonas Heggemann, Tore Niermann, Michael Lehmann, and Mario Dähne
Refined structure model of rare earth silicide nanowires on Si(001)
Appl. Phys. Lett. 114 (2019) 093104

DOI: 10.1063/1.5086369

Tolga Wagner, Tore Niermann, Felix Urban, Michael Lehmann
Nanosecond electron holography by interference gating
Ultramicroscopy 206 (2019) 112824

DOI: 10.1016/j.ultramic.2019.112824

Daniel Wolf, Nicolas Biziere, Sebastian Sturm, David Reyes, Travis Wade, Tore Niermann, Jonas Krehl, Benedicte Warot-Fonrose, Bernd Büchner, Etienne Snoeck, Christophe Gatel, and Axel Lubk
Holographic vector field electron tomography of three-dimensional nanomagnets
Communications Physics 2:87 (2019) 1

DOI: 10.1038/s42005-019-0187-8

Patent (granted)
Michael Lehmann, Tore Niermann and Tolga Wagner
“METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETRIC MEASUREMENT.” Publication number: EP3376522A1; TW201833521A; US2020103213A1; WO2018166786A1 (2018)

Patent: patentimages.storage.googleapis.com/3f/99/6a/e600762da71959/US20200103213A1.pdf

Christian Kuhn, Martin Martens, Frank Mehnke, Johannes Enslin, Peter Schneider, Christoph Reich, Felix Krueger, Jens Rass, Jae Bum Park, Viola Kueller, Arne Knauer, Tim Wernicke, Markus Weyers, Michael Kneissl,
Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics
Journal of Physics D: Applied Physics 51 (2018) 415101

DOI: 10.1088/1361-6463/aadb84

D. Wolf, R. Hubner, T. Niermann, S. Sturm, P. Prete, N. Lovergine, B. Buchner, A. Lubk
Three-Dimensional Composition and Electric Potential Mapping of III-V Core-Multishell Nanowires by Correlative STEM and Holographic Tomography
Nano Letters 18, 4777-4784 (2018)

DOI: 10.1021/acs.nanolett.8b01270

Norman Susilo, Georgios G Roumeliotis, Michael Narodovitch, Bernd Witzigmann, Monir Rychetsky, Silvio Neugebauer, Martin Guttmann, Johannes Enslin, Armin Dadgar, Tore Niermann, Tim Wernicke, André Strittmatter, Michael Lehmann, Dimitra N Papadimitriou, and Michael Kneissl
Accurate determination of polarization fields in (0001) c-plane InAlN/GaN heterostructures with capacitance-voltage-measurements
J. Phys. D: Appl. Phys. 51 (2018) 485103 (5pp)

DOI: 10.1088/1361-6463/aae464

M. Pomaska, A. Richter, F. Lentz, T. Niermann, F. Finger, U. Rau, K.N. Ding
Wide gap microcrystalline silicon carbide emitter for amorphous silicon oxide passivated heterojunction solar cells
Jap. Journal of Appl. Physics 56 (2017) 1-6

DOI: 10.7567/JJAP.56.022302

M. Al-Hada, S. Peters, L. Gregoratti, M. Amati, H. Sezen, P. Parisse, S. Selve, T. Niermann, D. Berger, M. Neeb, W. Eberhardt
Nanoparticle formation of deposited Ag-n-clusters on free-standing graphene
Surface Science 665 (2017) 108-113

DOI: 10.1016/j.susc.2017.06.002

T. Niermann, M. Lehmann, T. Wagner
Gated interference for time-resolved electron holography
Ultramicroscopy 182 (2017) 54–61

DOI: 10.1016/j.ultramic.2017.06.017

Sankaramangalam Ulhas Sharath, Stefan Vogel, Leopoldo Molina-Luna, Erwin Hildebrandt, Christian Wenger, Jose Kurian, Michael Duerrschnabel, Tore Niermann, Gang Niu, Pauline Calka, Michael Lehmann, Hans-Joachim Kleebe, Thomas Schroeder and Lambert Alff
Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfOx based Memristive Devices
Adv. Funct. Mater. 27 (2017) 1700432 (13pp)

DOI: 10.1002/adfm.201700432

G. Niu, M.A. Schubert, S.U. Sharath, P. Zaumseil, S. Vogel, C. Wenger, E. Hildebrandt, S. Bhupathi, E. Perez, L. Alff, M. Lehmann, T. Schroeder, and T. Niermann
Electron holography on HfO₂/HfO_2−x bilayer structures with multilevel resistive switching properties
Nanotechnology 28 (2017) 215702 (7pp)

DOI: 10.1088/1361-6528/aa6cd9

S. Neugebauer, M. P. Hoffmann, H. Witte, J. Bläsing, A. Dadgar, A. Strittmatter, T. Niermann, M. Narodovitch, and M. Lehmann
All metalorganic chemical vapor phase epitaxy of p/n-GaN tunnel junction for blue light emitting diode applications
Appl.Phys.Lett. 110 (2017) 102104

DOI:10.1063/1.4978268

Gang Niu, Giovanni Capellini, Fariba Hatami, Antonio Di Bartolomeo, Tore Niermann, Emad Hameed Hussein, Markus Andreas Schubert, Hans-Michael Krause, Peter Zaumseil, Oliver Skibitzki, Grzegorz Lupina, William Ted Masselink, Michael Lehmann, Ya-Hong Xie, and Thomas Schroeder
Selective Epitaxy of InP on Si and Rectification in Graphene/InP/Si Hybrid Structure
ACS Appl. Mater. Interfaces 8 (2016) 26948−26955

DOI: 10.1021/acsami.6b09592

Michael Lehmann and Hannes Lichte
Electron Holography
in: Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry
edited by C. Barry Carter and David B. Williams
Springer Verlag Berlin Heidelberg (2016), pages 215 - 232

DOI: 10.1007/978-3-319-26651-0
ISBN: 978-3-319-26649-7
Springer Verlag Berlin Heidelberg

Hannes Lichte and Michael Lehmann
Electron Waves, Interference & Coherence
in: Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry
edited by C. Barry Carter and David B. Williams
Springer Verlag Berlin Heidelberg (2016), pages 197 - 214

DOI: 10.1007/978-3-319-26651-0
ISBN: 978-3-319-26649-7
Springer Verlag Berlin Heidelberg

E.M. Sala, G. Stracke, S. Selve, T. Niermann, M. Lehmann, S. Schlichting, F. Nippert, G. Callsen, A. Strittmatter, and D. Bimberg
Growth and structure of In0.5Ga0.5Sb quantum dots on GaP(001)
Applied Physics Letters 109 (2016) 102102

DOI: 10.1063/1.4962273

Tore Niermann and Michael Lehmann
Holographic focal series: differences between inline and off-axis electron holography at atomic resolution
J. Phys. D: Appl. Phys. 49 (2016) 194002

DOI: 10.1088/0022-3727/49/19/194002

M. Klingsporn, S. Kirner, C. Villringer, D. Abou-Ras, I. Costina, M. Lehmann, and B. Stannowski
Resolving the nanostructure of plasma-enhanced chemical vapor deposited nanocrystalline SiOx layers for application in solar cells
Journal of Applied Physics 119 (2016) 223104

DOI: 10.1063/1.4953566

Gang Niu, Giovanni Capellini, Markus Andreas Schubert, Tore Niermann, Peter Zaumseil, Jens Katzer, Hans-Michael Krause, Oliver Skibitzki, Michael Lehmann, Ya-Hong Xie, Hans von Känel, and Thomas Schroeder
Dislocation-free Ge Nano-crystals via Pattern Independent Selective Ge Heteroepitaxy on Si Nano-Tip Wafers
Scientific Reports 6 (2016) 22709

DOI: 10.1038/srep22709

Gang Niu, Giovanni Capellini, Grzegorz Lupina, Tore Niermann, Marco Salvalaglio, Anna Marzegalli, Markus Andreas Schubert, Peter Zaumseil, Hans-Michael Krause, Oliver Skibitzki, Michael Lehmann, Francesco Montalenti, Ya-Hong Xie, and Thomas Schroeder
Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns
ACS Appl. Mater. Interfaces 8 (2016) 2017−2026

DOI: 10.1021/acsami.5b10336

Stephan Appelfeller, Martin Franz, Milan Kubicki, Paul Reiß, Tore Niermann, Markus Andreas Schubert, Michael Lehmann, and Mario Dähne
Capping of rare earth silicide nanowires on Si(001)
Applied Physics Letters 108 (2016) 013109 (4 pages)

DOI: 10.1063/1.4939693

L. Lupina, M. H. Zoellner, T. Niermann, B. Dietrich, G. Capellini, S. B. Thapa, M. Haeberlen, M. Lehmann, P. Storck, and T. Schroeder
Zero lattice mismatch and twin-free single crystalline ScN buffer layers for GaN growth on silicon
Applied Physics Letters 107 (2015) 201907

DOI: 10.1063/1.4935856

D. Quandt, J.-H. Schulze, A. Schliwa, Z. Diemer, C. Prohl, A. Lenz, H. Eisele, A. Strittmatter, U. W. Pohl, M. Gschrey, S. Rodt, S. Reitzenstein, D. Bimberg, M. Lehmann, M. Weyland
Strong charge carrier localization in InAs/GaAs sub-monolayer stacks prepared by Sb-assisted metalorganic vapor-phase epitaxy
Physical Review B 91 (2015) 235418

DOI: 10.1103/PhysRevB.91.235418

F. Kießling, T. Niermann, M. Lehmann, J.-H. Schulze, A. Strittmatter, A. Schliwa, and U.W. Pohl
Strain field of a buried oxide aperture
Physical Review B 91 (2015) 075306

DOI: 10.1103/PhysRevB.91.075306

A. Lubk, D. Wolf, P. Prete, N. Lovergine, T. Niermann, S. Sturm, H. Lichte
Nanometer-scale tomographic reconstruction of three-dimensional electrostatic potentials in GaAs/AlGaAs core-shell nanowires
Phys. Rev. B 90 (2014) 125404

DOI: 10.1103/PhysRevB.90.125404

J. B. Park, T. Niermann, D. Berger, A. Knauer, I. Koslow, M. Weyers, M. Kneissl, and M. Lehmann
Impact of electron irradiation on electron holographic potentiometry
Applied Physics Letters 105 (2014) 094102

DOI: 10.1063/1.4894718

G. Stracke, E. M. Sala, S. Selve, T. Niermann, A. Schliwa, A. Strittmatter, and D. Bimberg
Indirect and direct optical transitions in In0.5Ga0.5As/GaP quantum dots
Applied Physics Letters 104 (2014) 123107

DOI: 10.1063/1.4870087

Florian Genz, Tore Niermann, Bart Buijsse, Bert Freitag, Michael Lehmann
Advanced double-biprism holography with atomic resolution
Ultramicroscopy 147 (2014) 33 - 43

DOI: 10.1016/j.ultramic.2014.06.002

Falk Röder, Axel Lubk, Daniel Wolf, Tore Niermann
Noise estimation for off-axis electron holography
Ultramicroscopy 144 (2014) 32 - 42

DOI: 10.1016/j.ultramic.2014.04.002

J. Dietrich, D. Abou-Ras, S.S. Schmidt, T. Rissom, T. Unold, O. Cojocaru-Mirédin, T. Niermann, M. Lehmann, C.T. Koch, and C. Boit
Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se_2 thin films
Journal of Applied Physics 115 (2014) 103507

DOI: 10.1063/1.4867398

T. Niermann, M. Lehmann
Averaging scheme for atomic resolution off-axis electron holograms
Micron 63 (2014) 28 - 34

DOI: 10.1016/j.micron.2014.01.008

T. Niermann, J. Verbeeck, M. Lehmann
Creating arrays of electron vortices
Ultramicroscopy 136 (2014) 165 - 170

DOI: 10.1016/j.ultramic.2013.10.002

T. Niermann, D. Zengler, L. Tarnawska, P. Stork, T. Schroeder, M. Lehmann
Virtual GaN substrates via Sc₂O₃/Y₂O₃ buffers on Si(111): TEM characterization of growth defects
Journal of Applied Physics 113 (2013) 223501

DOI: 10.1063/1.4809561

L. Tarnawska, J. Dabrowski, T. Grzela, T. Niermann, M. Lehmann, R. Paszkiewicz, P. Storck, and T. Schroeder
Interface science of virtual GaN substrates on Si(111) via Sc₂O₃/Y₂O₃ buffers: Experiment and Theory
Journal of Applied Physics 113 (2013) 213507

DOI: 10.1063/1.4807907

T. Niermann, F. Kießling, M. Lehmann, J.-H. Schulze, T.D. Germann, K. Pötschke, A. Strittmatter, and U.W. Pohl
Atomic structure of closely stacked InAs submonolayer depositions in GaAs
Journal of Applied Physics 112 (2012) 083505

DOI: 10.1063/1.4758301

Martin Linck, Bert Freitag, Stephan Kujawa, Michael Lehmann, Tore Niermann
State of the art in atomic resolution off-axis electron holography
Ultramicroscopy 116 (2012) 13-23

DOI: 10.1016/j.ultramic.2012.01.019

Tore Niermann, Axel Lubk, Falk Röder:
A new linear transfer theory and characterization method for image detectors. Part I: Theory
Ultramicroscopy 115 (2012) 68-77

DOI: 10.1016/j.ultramic.2012.01.012

Axel Lubk, Falk Röder, Tore Niermann, Christophe Gatel, Sebastien Joulie, Florent Houdellier, Cesar Magen, Martin Hÿtch:
A new linear transfer theory and characterization method for image detectors. Part II: Experiment
Ultramicroscopy 115 (2012) 78-87

DOI: 10.1016/j.ultramic.2012.01.011

Simon Ploch, Jae Bum Park, Joachim Stellmach, Tilman Schwaner, Martin Frentrup, Tore Niermann, Tim Wernicke, Markus Pristovsek, Michael Lehmann, Michael Kneissl
Single phase (11-22) GaN on (10-10) sapphire grown by metal-organic vapor phase epitaxy
Journal of Crystal Growth 331 (2011) 25-28

DOI: 10.1016/j.jcrysgro.2011.06.057

Tore Niermann, Jae Bum Park, Michael Lehmann
Local estimation of lattice constants in HRTEM images
Ultramicroscopy 111 (2011) 1083-1092

DOI: 10.1016/j.ultramic.2011.03.014

Carlos Lizandara-Pueyo, Stephan Siroky, Markus R. Wagner, Axel Hoffmann, Juan S. Reparaz, Michael Lehmann, Sebastian Polarz
Shape Anisotropy Influencing Functional Properties: Trigonal Prismatic ZnO Nanoparticles as an Example
Adv. Funct. Mater. 21 (2011) 295-304

DOI: 10.1002/adfm.201000997

H. Lange, M. Mohr, M. Artemyev, U. Woggon, T. Niermann, C. Thomsen
Optical phonons in colloidal CdSe nanorods
Physica Status Solidi B 247 (2010) 2488-2497

DOI: 10.1002/pssb.201046042

S. Polarz, A. Orlov, A. Hoffmann, M. R. Wagner, C. Rauch, R. Kirste, W. Gehlhoff, Y. Aksu, M. Driess, M. W. E. van den Berg, M. Lehmann
A Systematic Study on Zinc Oxide Materials Containing Group I Metals (Li, Na, K)-Synthesis from Organometallic Precursors, Characterization, and Properties
Chem. Mater. 21 (2009) 3889–3897

DOI: 10.1021/cm9014223

P. Simon, H. Lichte, P. Formanek, M. Lehmann, R. Huhle, W. Carrillo-Cabrera, A. Harscher, H. Ehrlich
Electron holography of biological samples
Micron 39 (2008) 229 - 256

DOI: 10.1016/j.micron.2006.11.012

D. Geiger, H. Lichte, M. Linck, M. Lehmann
Electron Holography with Cs-corrected Transmission Electron Microscope
Microscopy and Microanalysis 14 (2008) 68 - 81

DOI: 10.1017/S143192760808001X

H. Lichte, M. Lehmann
Electron holography - basics and applications
Annu. Rev. Modern Physics 71 (2008) 016102

DOI: 10.1088/0034-4885/71/1/016102

H. Lange, M. Artemyev, U. Woggon, T. Niermann, C. Thomsen
Experimental investigation of exciton-LO-phonon couplings in CdSe/ZnS core/shell nanorods
Physical Review B 77 (2008) 193303

DOI: 10.1103/PhysRevB.77.193303

H. Lichte, P. Formanek, A. Lenk, M. Linck, Ch. Matzeck, M. Lehmann, P. Simon
Electron Holography: Application to Materials Questions
Annu. Rev. Mater. Res. 37 (2007) 539 - 588

DOI: 10.1146/annurev.matsci.37.052506.084232

S. Polarz, A. Roy, M. Lehmann, M. Driess, F.E. Kruis, A. Hoffmann, P. Zimmer
Structure-Property-Function Relationships in Nanoscale Oxide Sensors: A Case Study Based on Zink Oxide
Adv. Funct. Materials 17 (2007) 1385

DOI: 10.1002/adfm.200700139

A. Orlov, A. Roy, M. Lehmann, M. Driess, S. Polarz
Organometallics Meets Colloid Chemistry: A Case Study in Three Phases Based on Molecular Carbonyl Precursors Containing Zinc and Manganese
J. Am. Chem. Soc. 129 (2007) 371-375

DOI: 10.1021/ja0659626

M. Linck, H. Lichte, M. Lehmann
Off-Axis Electron Holography: Materials Analysis at Atomic Resolution
Int. Journal of Materials Research 7 (2006) 890 - 898

DOI: 10.1515/ijmr-2006-0144

M. Lehmann
Exit surface dependence of the wavefunction measured and corrected by means of off-axis electron holography
Physica Status Solidi (a) 202 (2005) 2386 - 2396

DOI: 10.1002/pssa.200521269

M. Lehmann, H. Lichte
Electron Holographic Material Analysis at Atomic Dimensions
Crystal Research and Technology 40 (2005) 149 - 160

DOI: 10.1002/crat.200410318

M. Lehmann
Influence of the Elliptical Illumination on Acquisition and Correction of Coherent Aberrations in High-Resolution Electron Holography
Ultramicroscopy 100 (2004) 9 - 23

DOI: 10.1016/j.ultramic.2004.01.005

M. Lehmann, H. Lichte
Tutorial on Off-axis Electron Holography
Microscopy and Microanalysis 8 (2002) 447 - 466

DOI: 10.1017/S1431927602020147

H. Lichte, M. Reibold, K. Brand, M. Lehmann
Ferroelectric Electron Holography
Ultramicroscopy 93 (2002) 199 - 212

DOI: 10.1016/S0304-3991(02)00277-2

P. Simon, R. Huhle, M. Lehmann, H. Lichte, D. Mönter, Th. Bieber, W. Reschetilowski, R. Adhikari, G.H. Michler
Electron holography on beam sensitive materials: organic polymers and mesoporous silica
Chemistry of Materials 14 (2002) 1505 - 1514

DOI: 10.1021/cm011140q

H. Lichte, M. Lehmann
Electron holography – a powerful tool for the analysis of nanostructures
Advances in Imaging and Electron Physics, Vol. 123 (2002) 225 - 255

Elsevier, ISBN: 0-12-014765-3

M. Mertig, R. Wahl, M. Lehmann, P. Simon, W. Pompe
Formation and manipulation of regular metallic nanoparticle arrays on bacterial surface layers: an advanced TEM study
Eur. Phys. J. D 16, 317 – 320 (2001)

DOI: 10.1007/s100530170119

M. Klimenkov, W. Matz, S.A. Nepijko, M. Lehmann
Crystallisation of Ge nanoclusters in SiO₂ caused by electron irradiation in TEM
Nuclear Instruments and Methods in Physics Research B 179 (2001) 209 - 214

DOI: 10.1016/S0168-583X(01)00452-9

T. Walter, K. Dörr, K.-H. Müller, D. Eckert, K. Nenkov, M. Hecker, M. Lehmann, L. Schultz
Magnetic and electrical properties of coherently grown low-strain La_0.7Ca_0.3MnO₃ films
Journal of Magnetism and Magnetic Materials 222 (2000) 175 - 181

DOI: 10.1016/S0304-8853(00)00550-3

M. Lehmann
Determination and Correction of the Coherent Wave Aberration from a Single Off-axis Electron Hologram by means of a Genetic Algorithm
Ultramicroscopy 85 (2000) 165 - 182

DOI: 10.1016/S0304-3991(00)00054-1

E. Völkl, M. Lehmann
The reconstruction of off-axis electron holograms
in: Introduction to Electron Holography, edited by E. Völkl, L.F. Allard, D.C. Joy, Kluwer Academics/Plenum Publishers (1999) 125 - 151, ISBN: 0-306-44920-X

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